发明名称 Measuring apparatus, measuring method, and test apparatus
摘要 There is provided a measuring apparatus that generates a first strobe signal and a second strobe signal in synchronization with an output signal, sequentially changes phases of the strobe signals whenever the electronic device outputs the output signal multiple times, acquires a signal level of the output signal at each phase of the strobe signals by the multiple times, counts the number of times by which the signal level of the output signal to the first strobe signal is a High level for each phase of the first strobe signal, counts the number of times by which the signal level of the output signal to the second strobe signal is a Low level for each phase of the second strobe signal, and computes a phase of a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter based on the counted number of times. The measuring apparatus measures a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter by one-time test.
申请公布号 US7262627(B2) 申请公布日期 2007.08.28
申请号 US20060497506 申请日期 2006.08.01
申请人 ADVANTEST CORPORATION 发明人 YAMANE TOMOYUKI;NIIJIMA HIROKATSU
分类号 G01R31/26;G01R29/26;G01R31/28 主分类号 G01R31/26
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