| 摘要 |
A functional block under test (FBUT), comprising mixed-signal or analog circuits, can be tested by a digital test machine (DTM). A DTM sources test vectors to, and expects to receive certain vectors back from, a DUT. The DUT is a single, physically contiguous, IC upon which is integrated the FBUT, a mixed-signal generate and capture unit (MSGC) and a control system. The test vectors can include computer programs for instructing the control system on how to perform mixed-signal or analog-domain tests of the FBUT using resources of the MSGC (such as DACs and ADCs). The test vectors can also include data that effects the operation of a parameterized test procedure, where the test procedure is part of the control system. The control system, in accordance with the test procedure, uses the MSGC to perform mixed-signal or analog-domain tests of the FBUT. The FBUT can include an analog test bus.
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