发明名称 Oscillator characteristics testing method e.g. for quartz oscillator, involves applying signals with same frequency but different amplitude, to oscillator chip for multiple times, to determine conformity of oscillator
摘要 The signals with same frequencies but different amplitude, are applied multiple times from a network analyzer 6) to an oscillator chip (4) through the electrodes (2,3). The corresponding outputs of the oscillator chip are measured and stored in memory of personal computer (1). The stored results are compared so as to determine whether the oscillator chip is conforming or not conforming item.
申请公布号 DE10250323(A1) 申请公布日期 2003.09.18
申请号 DE2002150323 申请日期 2002.10.29
申请人 HUMO LABORATORY, LTD. 发明人 NONAKA, SATOSHI
分类号 H03H3/02;G01H3/00;G01R31/28;(IPC1-7):G01R31/26;G01R27/28;G01R29/22 主分类号 H03H3/02
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