发明名称 Simultaneous rapid open and closed loop bode plot measurement using a binary pseudo-random sequence
摘要 A simultaneous rapid open and closed loop bode measurement plot is described in which testing of the servo controlled instrument occurs under closed loop conditions using a binary pseudo-random sequence. The binary pseudo-random sequence is injected into the servo while the system under test is operating closed loop in order to generate bode plots for open loop and closed loop conditions. The present invention provides measurement results approximately 1,000 times faster than a swept sinusoid approach and provides superior dynamic range as compared to random white noise test input sources.
申请公布号 US2003176983(A1) 申请公布日期 2003.09.18
申请号 US20020094965 申请日期 2002.03.12
申请人 ITT MANUFACTURING ENTERPRISES, INC. 发明人 JOSSELSON ROBERT H.;PREDINA JOE P.
分类号 G05B23/02;(IPC1-7):G06F19/00 主分类号 G05B23/02
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