发明名称 Capacitor structure and fabrication method therefor in a dual damascene process
摘要 An apparatus and fabrication process for a capacitor formed in conjunction with a dual damascene process. A bottom capacitor plate is electrically connected to an overlying first conductive via formed according to the dual damascene process. A top capacitor plate is connected to an overlying second conductive via. A dielectric material is disposed between the top and the bottom plates. The capacitor is formed by successively forming the bottom plate, the dielectric layer, and the top plate, patterning these layers as required after their formation. The first conductive via is formed over and electrically connected to the bottom plate and the second conductive via is formed over and connected to the top capacitor plate thereby providing for interconnection of the capacitor to other circuit elements by way of the dual damascene conductive runners connected to the conductive vias.
申请公布号 GB0319129(D0) 申请公布日期 2003.09.17
申请号 GB20030019129 申请日期 2003.08.14
申请人 AGERE SYSTEMS INC 发明人
分类号 H01L21/02;H01L21/768;H01L21/822;H01L23/522;H01L27/04 主分类号 H01L21/02
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