发明名称 Method for roughening semiconductor surface
摘要 In order to provide a method for easily roughening a surface of a semiconductor constituting an LED, a first material 18 and a second material 20 having a property that they are nonuniformly mixed when thermally treated are deposited on a semiconductor 16, the structure is thermally treated, and etching is performed through reactive ion etching in which the etching rate with respect to the first material 18 is slower than the etching rates with respect to the second material 20 and to the semiconductor 16. During this process, a region 22 in which the first material 18 is the primary constituent functions as an etching mask, and a predetermined roughness can be easily formed on the surface of the semiconductor 16. <IMAGE> <IMAGE> <IMAGE>
申请公布号 EP1345275(A1) 申请公布日期 2003.09.17
申请号 EP20020100242 申请日期 2002.03.13
申请人 SAKAI, SHIRO;NITRIDE SEMICONDUCTORS CO., LTD. 发明人 SAKAI, SHIRO;LACROIX, YVES
分类号 H01L21/302;H01L21/033;H01L21/3065;H01L21/308;H01L33/32;(IPC1-7):H01L33/00 主分类号 H01L21/302
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