发明名称 X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
摘要 A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.
申请公布号 US6621888(B2) 申请公布日期 2003.09.16
申请号 US20020190903 申请日期 2002.07.08
申请人 AMERICAN SCIENCE AND ENGINEERING, INC. 发明人 GRODZINS LEE;ADAMS WILLIAM;ROTHSCHILD PETER
分类号 G01N23/20;G01N23/201;G01V5/00;(IPC1-7):G01N23/04 主分类号 G01N23/20
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