发明名称 |
X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects |
摘要 |
A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.
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申请公布号 |
US6621888(B2) |
申请公布日期 |
2003.09.16 |
申请号 |
US20020190903 |
申请日期 |
2002.07.08 |
申请人 |
AMERICAN SCIENCE AND ENGINEERING, INC. |
发明人 |
GRODZINS LEE;ADAMS WILLIAM;ROTHSCHILD PETER |
分类号 |
G01N23/20;G01N23/201;G01V5/00;(IPC1-7):G01N23/04 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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