发明名称 Aluminum hardmask for dielectric etch
摘要 An aluminum hardmask (106, 214) is used for etching a dielectric layer (102, 210). A fluorine-based etch is used that does not etch the aluminum hardmask (106, 210). The aluminum hardmask (106, 214) is then removed by CMP.
申请公布号 US6620727(B2) 申请公布日期 2003.09.16
申请号 US20010935450 申请日期 2001.08.23
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BRENNAN KENNETH D.
分类号 H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/3065
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