发明名称 Biasing technique for a high density SRAM
摘要 According to one embodiment, a memory cell is disclosed. The memory cell includes a first PMOS transistor, a first NMOS transistor coupled to the first PMOS transistor, a second PMOS transistor and a second NMOS transistor coupled to the first PMOS transistor. The first and second PMOS transistors receiving a bias control signal.
申请公布号 US6621726(B2) 申请公布日期 2003.09.16
申请号 US20010991864 申请日期 2001.11.13
申请人 INTEL CORPORATION 发明人 ZHANG KEVIN X.;WEI LIQIONG
分类号 G11C11/412;(IPC1-7):G11C11/40 主分类号 G11C11/412
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