发明名称 PROJECTION OPTICAL SYSTEM ADJUSTMENT METHOD, PREDICTION METHOD, EVALUATION METHOD, ADJUSTMENT METHOD, EXPOSURE METHOD, EXPOSURE DEVICE, PROGRAM, AND DEVICE MANUFACTURING METHOD
摘要 <p>When a pattern is transferred via a projection optical system, a size of an image of the pattern varies depending on a defocus amount of a transferring position from the best focus position, and a flucuation curve showing the variation (the so-called CD-focus curve) varies depending on wavefront aberration of the projection optical system. There is a close relation between a linear combination value of a plurality of terms that each have a coefficient (an aberration component) of a plurality of Zernike terms (aberration component terms) into which the wavefront aberration of the projection optical system is decomposed using a Zernike polynomial in series expansion, and the variation of the flucuation curve. Accordingly, by using the above relation, the CD-focus curve related to the pattern via a projection optical system whose aberration state is predetermined exposed under predetermined exposure conditions can be predicted within a short period of time by a simple calculation of obtaining the linear combination value of a plurality of terms that each have an aberration component.</p>
申请公布号 AU2003211559(A1) 申请公布日期 2003.09.16
申请号 AU20030211559 申请日期 2003.02.28
申请人 NIKON CORPORATION 发明人 SHIGERU HIRUKAWA;TOSHIHARU NAKASHIMA;KENJI HIGASHI
分类号 G03F7/20;(IPC1-7):H01L21/027 主分类号 G03F7/20
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