发明名称 Substrate rinsing and drying method
摘要 The wafers W are dipped and rinsed in pure water in the processing bath 60, and then dichloromethane is fed into the processing bath 60, thereby changing the state of the wafer W from being dipped in pure water to being dipped in dichloromethane. Thereafter, the wafers W is raised up to the drying chamber 61, and dichloromethane remained on the surface of each wafer W is evaporated, and the hot N2 gas is discharged onto the wafers W. Thereby, no water marks are produced, and no resist is dissolved, and the substrate can be dried in safety.
申请公布号 US6620260(B2) 申请公布日期 2003.09.16
申请号 US20010858107 申请日期 2001.05.15
申请人 TOKYO ELECTRON LIMITED 发明人 KUMAGAI YOSHIO;TOSHIMA TAKAYUKI
分类号 B08B3/08;H01L21/306;(IPC1-7):B08B3/00;B08B3/04;B08B5/00 主分类号 B08B3/08
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