发明名称 |
APPARATUS FOR INSPECTION OF THREE-DIMENSIONAL SHAPE AND METHOD FOR INSPECTION BY THE SAME |
摘要 |
An apparatus for inspecting a three-dimensional shape and an inspection method using the same are provided to improve the accuracy of an image by using a display control unit for complementarily controlling the brightness with respect to the reflectivity of each pixel. An apparatus for inspecting a three-dimensional shape comprises a light source(200), a beam splitter(220), a projection unit(210), and an imaging unit(240). The beam splitter splits beam from the light source to the surface of an object(P) and a reflector(230). The projection unit projects the beam from the light source to the beam splitter. The imaging unit captures a beam pattern overlapped from the inspection surface and the reflector. Defects in the object are detected by measuring a three-dimensional shape of the object from the captured image. The projection unit includes a display control unit(211) controlling the brightness of the beam projected to the beam splitter according to pixel. The reflector includes a display control unit(231) complementarily controlling brightness with respect to the brightness of the projection unit.
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申请公布号 |
KR20080089314(A) |
申请公布日期 |
2008.10.06 |
申请号 |
KR20080070755 |
申请日期 |
2008.07.21 |
申请人 |
INTEKPLUS CO., LTD. |
发明人 |
LIM, SSANG GUN;LEE, SSANG YUN;KANG, MIN GU |
分类号 |
G01B11/24;G01B11/00 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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