发明名称 APPARATUS FOR INSPECTION OF THREE-DIMENSIONAL SHAPE AND METHOD FOR INSPECTION BY THE SAME
摘要 An apparatus for inspecting a three-dimensional shape and an inspection method using the same are provided to improve the accuracy of an image by using a display control unit for complementarily controlling the brightness with respect to the reflectivity of each pixel. An apparatus for inspecting a three-dimensional shape comprises a light source(200), a beam splitter(220), a projection unit(210), and an imaging unit(240). The beam splitter splits beam from the light source to the surface of an object(P) and a reflector(230). The projection unit projects the beam from the light source to the beam splitter. The imaging unit captures a beam pattern overlapped from the inspection surface and the reflector. Defects in the object are detected by measuring a three-dimensional shape of the object from the captured image. The projection unit includes a display control unit(211) controlling the brightness of the beam projected to the beam splitter according to pixel. The reflector includes a display control unit(231) complementarily controlling brightness with respect to the brightness of the projection unit.
申请公布号 KR20080089314(A) 申请公布日期 2008.10.06
申请号 KR20080070755 申请日期 2008.07.21
申请人 INTEKPLUS CO., LTD. 发明人 LIM, SSANG GUN;LEE, SSANG YUN;KANG, MIN GU
分类号 G01B11/24;G01B11/00 主分类号 G01B11/24
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