发明名称 TEST APPARATUS OF HIGH VOLTAGE POWER SUPPLY AND METHOD FOR TESTING THE SAME
摘要 PURPOSE: A test apparatus of a high voltage power supply and a method for testing the same are provided to eliminate the high cost test apparatus for generating and measuring the pulse width modulation(PWM) signal for each channel by automatically increasing and decreasing the PWM duty for each channel in response to the test condition inputted by the user. CONSTITUTION: A test apparatus of a high voltage power supply includes a key selection block(11), a direct current power supplying block(12), a pulse wave modulation(PWM) generation block(13), a PWM output block(14), an input block(15), a measuring block(16), a storage block(17), a control block(18), a display block(19) and a communication block(20). In the test apparatus, the PWM generation block(13) generates a plurality of PWM signal for each channel in response to the test condition inputted from the key selection block(11). The PWM output block(14) connected corresponding to each channel of the PWM generation block(13) outputs the PWM signal for each channel. The measuring block(16) includes a high voltage measuring block(16a) connected to the high voltage input block(15a) and a low voltage measuring block(16b) connected to the low voltage input block(15b). The measuring block(16) reduces the various voltage and current inputted through the input block(15) by a predetermined level and converts the reduced voltage and current into a digital signal to output. The control block(18) detect the test condition by comparing/analyzing the selection signal applied from the key selection block(11), outputs the PWM signals in response to the test condition and control the overall operation to be stored by converting the voltage and current signals generated from the test apparatus to be tested into the digital data.
申请公布号 KR20030072150(A) 申请公布日期 2003.09.13
申请号 KR20020011730 申请日期 2002.03.05
申请人 SYS HITEK CO., LTD. 发明人 LEE, SEOK WON
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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