发明名称 METHOD AND SYSTEM FOR MONITORING AND CONTROLLING MALFUNCTION STATE
摘要 <p><P>PROBLEM TO BE SOLVED: To improve reliability of an apparatus by detecting the malfunction state accurately and in more detail regarding the states such as a transient state and a reserve state, in a method and system for monitoring and controlling the malfunction state. <P>SOLUTION: Function sections 10, 20 to be monitored detect a transient state and a reserve state in state transition, such as during reset operation or during switching active/reserve as a factor of the defective state, and when detecting the malfunction state including the factor of defective state, the sections 10, 20 inform a monitoring a control section 30 of defective (NG) state information. If the failure (NG) state information is continuously informed for a time not shorter than a prescribed time preset in a failure detecting timer, the section 30 determines that it is in a defective state, and detects the defective state. The sections 10, 20 each transmit a mask notification signal for inhibiting defect detection in a transient state to the section 30, and the section 30 stops detecting a defective state for a prescribed time, according to the mask notification signal and detects a defective state for the sections 10, 20 after the mask is released. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003258684(A) 申请公布日期 2003.09.12
申请号 JP20020055863 申请日期 2002.03.01
申请人 FUJITSU LTD 发明人 TAKAHASHI KOICHI
分类号 H04M3/22;H04B1/74;H04B3/46;(IPC1-7):H04B1/74 主分类号 H04M3/22
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