| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device of which through put of relieving process after assembling is improved. SOLUTION: The device is provided with a first storage section (105) in which a defective address corresponding to a defective wiring of a memory cell (11), a data comparing section (101) comparing read-out data read out from the memory cell (11) with an expected value to be read out from the memory cell (11) and outputting an uncoincidence signal (err) indicating a result of the comparison, and a relieving discriminating section (102) detecting the defective address based on the uncoincidence signal (err). COPYRIGHT: (C)2003,JPO
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