发明名称 METHOD AND SYSTEM FOR SORTING CAPACITOR
摘要 PROBLEM TO BE SOLVED: To sort a multilayer capacitor in a short time by measuring the insulating resistance surely. SOLUTION: External voltage and current being applied to a multilayer capacitor being sorted are controlled while lowering the voltage as much as possible, and the insulating resistance is measured by setting an applying power at 50 mW or less. Subsequently, the insulating resistance is measured by setting the applying power to 51 mW or above and a capacitor having an insulating resistance lower than a predetermined reference value is precluded as a rejectable product. A multilayer capacitor possibly having a defect caused by micro short circuit, or the like, is thereby precluded previously and a rejectable product having an insulating resistance temporarily normalized by removing the defect caused by micro short circuit, or the like, through welding is prevented from being delivered thus detecting a rejectable product surely. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257800(A) 申请公布日期 2003.09.12
申请号 JP20020060542 申请日期 2002.03.06
申请人 MURATA MFG CO LTD 发明人 KAWAGUCHI YOSHIO;OKUBO HIROSHI
分类号 G01R31/18;G01R27/02;G01R31/00;G01R31/01;H01G13/00;(IPC1-7):H01G13/00 主分类号 G01R31/18
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