发明名称 METHOD FOR MANUFACTURING SILICON WAFER AND FOR SILICON EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a silicon wafer capable of making more uniform a film thickness distribution of a silicon thin film (e.g. an epitaxial layer) of a silicon wafer (e.g. a silicon epitaxial wafer). SOLUTION: In a method for manufacturing a silicon wafer, a material gas is supplied to a main surface of a silicon single crystal substrate 2 to carry out a vapor phase growth of a silicon thin film on the main surface. The silicon single crystal substrate 2 arranged in an almost horizontal state is rotated in a plate plane direction, and simultaneously the material gas is supplied almost parallel to the main surface of the silicon single crystal substrate 2 to carry out the vapor phase growth. A course of the material gas is changed during the vapor phase growth. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257869(A) 申请公布日期 2003.09.12
申请号 JP20020053991 申请日期 2002.02.28
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 YAMADA TORU
分类号 C23C16/24;C23C16/455;H01L21/205;(IPC1-7):H01L21/205 主分类号 C23C16/24
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