| 摘要 |
Misinstallation of a DSA to a semiconductor test instrument and connection failure of a connector are reliably detected and prevented. A semiconductor test instrument comprises a pair of DSAs (10a, 10b) on which socket boards are mounted and a mother board (20) having connectors to which connectors (14) of the socket boards (11) of the DSAs (10a, 10b) are connected. Each of the DSAs (10a, 10b) has an ID setting board for setting an ID number given to each DSA (10a, 10b) and outputting an ID signal representing the ID number, a coincidence circuit for receiving the outputted ID signal and detecting coincidence of the ID signal, a daisy chain circuit for receiving a signal from one of the connectors (21) of the mother board (20), transmitting the signal to all the connectors (21, 14) through the corresponding connectors (14) on the DSA side sequentially, and detecting an output signal. |
