发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the source resistance of a field effect transistor due to a GaN system semiconductor and increasing drain currents. SOLUTION: Plasma treatment is performed with a proper vacuum degree on the surface of a GaN system semiconductor 502, and the surface of the GaN system semiconductor 502 is improved, and surface potential for electrons is selectively decreased. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003257996(A) |
申请公布日期 |
2003.09.12 |
申请号 |
JP20020052727 |
申请日期 |
2002.02.28 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
INOUE KAORU;IKEDA YOSHITO;HIROSE YUTAKA;NISHII KATSUNORI |
分类号 |
H01L21/338;H01L29/20;H01L29/778;H01L29/812;(IPC1-7):H01L21/338 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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