发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the source resistance of a field effect transistor due to a GaN system semiconductor and increasing drain currents. SOLUTION: Plasma treatment is performed with a proper vacuum degree on the surface of a GaN system semiconductor 502, and the surface of the GaN system semiconductor 502 is improved, and surface potential for electrons is selectively decreased. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257996(A) 申请公布日期 2003.09.12
申请号 JP20020052727 申请日期 2002.02.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 INOUE KAORU;IKEDA YOSHITO;HIROSE YUTAKA;NISHII KATSUNORI
分类号 H01L21/338;H01L29/20;H01L29/778;H01L29/812;(IPC1-7):H01L21/338 主分类号 H01L21/338
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