发明名称 SEMICONDUCTOR WAFER ETCHING APPARATUS AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor wafer etching apparatus which can improve an etching rate better than that of a prior art, can perform every etching process by a wet etching method with higher accuracy and can further include a chemical solution collecting system. SOLUTION: This semiconductor wafer etching apparatus includes a shingle sheet type rotating disk or a batch type rotating disk for two or more wafers, is provided with a supply port and a slit for supplying the chemical solution for etching in a manner to cancel the distribution of pressure of the chemical solution on the rotating disk and also includes a line to pressurize an etching vessel. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257928(A) 申请公布日期 2003.09.12
申请号 JP20020050987 申请日期 2002.02.27
申请人 NEC TOKIN CORP 发明人 ONO KAZUYUKI
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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