发明名称 ELECTRON MICROSCOPE WITH ENERGY FILTER
摘要 PROBLEM TO BE SOLVED: To enable space-effective placement of an energy filter while maintaining symmetric property without restriction of an energy filter and controlling the height. SOLUTION: In the electron microscope with an energy filter between an objective lens and an image observing and recording system, optical axes of lens barrels 1 and 2 of the objective lens and the image recording system are placed in parallel, a filter surface S containing a line L, which links an outgoing part A of the objective lens and an incident part B of the image observing and recording system, is set, and an energy filter containing an incident deflection magnet, which deflects electron beams at the outgoing part A of the objective lens in the direction parallel to the filter surface S, and an outgoing deflection magnet, which deflects electron beams from the direction parallel to the filter surface S to the incident direction to the incident part B of the image observing and recording system, is placed in parallel with the filter face S. It enables space-effective placement of the energy filter while symmetric property can be maintained without restrictions of the energy filter, and the height can be controlled. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257354(A) 申请公布日期 2003.09.12
申请号 JP20020058166 申请日期 2002.03.05
申请人 JEOL LTD 发明人 TSUNO KATSUSHIGE
分类号 G21K1/093;G21K5/04;H01J37/05;H01J37/26;(IPC1-7):H01J37/26 主分类号 G21K1/093
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