发明名称 Semiconductor memory cell with trench capacitor and selection transistor and method for fabricating it
摘要 A semiconductor memory cell is formed in a substrate and includes a trench capacitor and a selection transistor. The trench capacitor includes a capacitor dielectric and a conductive trench filling. Disposed on the conductive trench filling is a diffusion barrier on which an epitaxial layer is formed. The selection transistor is disposed as a planar transistor above the trench capacitor. A drain doping region of the selection transistor is disposed in the epitaxial layer.
申请公布号 US2003168690(A1) 申请公布日期 2003.09.11
申请号 US20030390871 申请日期 2003.03.17
申请人 KARCHER WOLFRAM;TEMMLER DIETMAR;SCHREMS MARTIN 发明人 KARCHER WOLFRAM;TEMMLER DIETMAR;SCHREMS MARTIN
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/8242
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