Process to determine parameters for the simulation of an electronic circuit and to design electronic circuits uses multidimensional data vectors and location depth

摘要

A process to find electronic circuit simulation parameters for circuit design determines wafer electrical test parameters (1) for semiconductor production control use, arranges as multidimensional data vectors and computes location depth (2). Corner vectors below thresholds are found (3) and transformed to simulation data (8). An Independent claim is also included for a process as above using test parameters from a given wafer.