发明名称 Semiconductor device capable of preventing ring defect and method of manufacturing the same
摘要 A semiconductor device capable of preventing a ring defect and a method of manufacturing the same are provided. The semiconductor device includes a semiconductor substrate having a junction region, a planarization layer having a first contact hole portion through which the junction region is exposed, an interlayer dielectric layer formed on the planarization layer and having a second contact hole portion extended from the first contact hole portion, and contact spacers formed at the sidewalls of the first and second contact hole portions. Here, the contact spacers are formed to cover the interface between the planarization layer and the interlayer dielectric layer and the interface between the planarization layer and the semiconductor substrate.
申请公布号 US2003170979(A1) 申请公布日期 2003.09.11
申请号 US20020108700 申请日期 2002.03.29
申请人 KIM SI YOUN 发明人 KIM SI YOUN
分类号 H01L21/768;H01L23/485;(IPC1-7):H01L21/476;H01L21/44;H01L23/48;H01L29/40 主分类号 H01L21/768
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