| 摘要 |
<P>PROBLEM TO BE SOLVED: To derive various physical quantities relating to an ion conducting film. <P>SOLUTION: This device is provided with an ion conductive film measuring part 2 to measure the intensity of a transmitted electromagnetic wave 20 which has been transmitted through the ion conductive film 12 by irradiating the ion conductive film 12 with an electromagnetic wave 19 having a band overlapping with a range of 0.01 THz-100 THz, and an ion conductive film evaluating device body 3 to derive physical quantities relating to the ion conductive film 12 based on the intensity. Various physical quantities relating to the ion conductive film 12 can be derived by using such transmissive electromagnetic wave 20. <P>COPYRIGHT: (C)2003,JPO |
