发明名称 CONTACT PROBE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a contact probe suppressing drop in electric contact caused by shavings of an insulating film attached to a contact terminal when the insulating film formed on a surface to be measured is shaved off. SOLUTION: A tip part 1 for contacting to the surface to be measured on which the insulating film is formed and a supporting part 3 supporting the tip part and for connecting electricity (a signal) from the tip part to the outside are connected in a single unit directly or through a spring part 3, and the tip part 1 has cutting terminals 5a, 5b for shaving off the insulating film when pushed against the surface to be measured and a conducting terminal 4 pushed against the surface to be measured and becoming electrically conductive. Since being shaved off with the cutting terminals 5a, 5b, the most shavings are attached to the cutting terminals 5a, 5b. Therefore, the amount of the shavings attached to the conducting terminal 4 is little, and drop in electric contact caused by the shavings can be suppressed. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003254994(A) 申请公布日期 2003.09.10
申请号 JP20020055119 申请日期 2002.03.01
申请人 SUMITOMO ELECTRIC IND LTD 发明人 NAKAMAE KAZUO
分类号 G01R31/26;G01R1/067;G01R31/28;H01L21/66;(IPC1-7):G01R1/067 主分类号 G01R31/26
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