发明名称 |
METHOD FOR MAKING AN INTEGRATED CIRCUIT IN THREE DIMENSIONS |
摘要 |
Method of making an integrated circuit, comprising at least the following steps:;a) form a first semiconducting or conducting element, covered with a first insulating layer on which there is a second semiconducting or conducting element, covered with a second insulating layer;;b) form an opening passing through at least the second insulating layer, exposing a portion of the second element and opening up at least partly on the second element or adjacent to the second element;;c) form a spacer located at the second element and comprising at least one dielectric material located at least between the second element and the opening;;d) prolong the opening through the first insulating layer as far as the first element; and;e) fill the opening with at least one conducting material, so as to form a contact.;FIG 1G. |
申请公布号 |
US2016181155(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201514976958 |
申请日期 |
2015.12.21 |
申请人 |
Commissariat a L'Energie Atomique et aux Energies Alternatives |
发明人 |
DEPRAT Fabien;BATUDE Perrine;MORAND Yves;NIEBOJEWKSI Heimanu;POSSEME Nicolas |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method of making an integrated circuit, comprising at least the following steps:
a) form a first semiconducting or conducting element, covered with a first insulating layer on which a second semiconducting or conducting element is arranged, covered with a second insulating layer; b) form an opening passing through at least the second insulating layer, exposing a portion of the second element and opening up at least partly on the second element or adjacent to the second element; c) form a spacer located at the second element and comprising at least one dielectric material located at least between the second element and the opening; d) prolong the opening through the first insulating layer as far as the first element; e) fill the opening with at least one conducting material, so as to form a contact; and in which step c) to form the spacer comprises at least the following steps:
isotropic etching of a part of the second element including at least said portion of the second element, so as to form a cavity located between the first and second insulating layers;deposit at least one dielectric material at least on the walls of the opening and in the cavity; andeliminate the dielectric material except in the cavity. |
地址 |
Paris FR |