| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To verify operation of a semiconductor integrated circuit at less than a prescribed detection level, in the semiconductor integrated circuit whose circuit operation is stopped by detecting that a power supply potential has become less than the prescribed potential detection level due to power supply cutoff. <P>SOLUTION: When a potential of a power supply 10 becomes less than the prescribed potential detection level, a potential detecting circuit 12 outputs a potential detection signal 101, a potential generating circuit 13 stops the output of the potential at the prescribed potential detection level, and a potential of a cable 15 is lowered. In this state, the semiconductor integrated circuit stops its operation. When the operation of the semiconductor integrated circuit is evaluated, a control signal is input to the circuit 12 from an external terminal 11, and the operation of the circuit 12 is stopped forcibly. Thereby, the operation can be evaluated in a low-voltage operation, by lowering the potential of the power supply 10 to less than the prescribed potential detection level of the circuit 12, and the operation of the semiconductor integrated circuit at a prescribed operation lower-limit potential can be evaluated. <P>COPYRIGHT: (C)2003,JPO</p> |
