发明名称 HALFTONE PHASE SHIFT MASK AND BLANK AND METHOD FOR TRANSFERRING PATTERN
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a blank for a halftone phase shift mask reduced in a halftone film thickness in a short wavelength region, and a halftone phase shift mask using the same, and a method for transferring patterns using the same. <P>SOLUTION: The blank for the halftone phase shift mask is provided with a phase shift layer mainly having a phase shift effect and a transmittance regulating layer relating mainly to transmittance on a glass substrate. Both of these two-layered films are thin films consisting of a metal silicide or its compound and the transmittance regulating layer of these films is formed of a thin film essentially consisting of metal, silicon and nitrogen. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003255513(A) 申请公布日期 2003.09.10
申请号 JP20020058398 申请日期 2002.03.05
申请人 TOPPAN PRINTING CO LTD 发明人 KANAYAMA KOICHIRO;MATSUO TADASHI;HARAGUCHI TAKASHI;YAMAZAKI TSUKASA;IWAKATA MASAHIDE
分类号 G03F1/32;G03F1/54;G03F7/20;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/32
代理机构 代理人
主权项
地址