发明名称 MANUFACTURING METHOD FOR SILICON DEVICE AND MANUFACTURING METHOD FOR INKJET RECORDING HEAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method for silicon devices in which a manufacturing efficiency can be improved and a sacrifice wafer can be removed surely, and a manufacturing method for inkjet recording heads. <P>SOLUTION: The manufacturing method for the silicon device which has a thin film pattern on a silicon substrate includes a process of joining the sacrifice wafer 110 comprising a silicon monocrystal substrate to one face of a silicon wafer 100, a process of forming the thin film pattern on the silicon wafer, a process of forming a correcting mask 130 comprising a plurality of correcting parts 57 arranged in a predetermined pattern by patterning a silicon dioxide film 56 on a surface of the sacrifice wafer 110, and a process of removing the sacrifice wafer 110 by anisotropic etching via the correcting mask 130. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003251804(A) 申请公布日期 2003.09.09
申请号 JP20020060852 申请日期 2002.03.06
申请人 SEIKO EPSON CORP 发明人 YASOJIMA TAKESHI;MATSUZAWA AKIRA
分类号 B41J2/045;B41J2/055;B41J2/135;B41J2/14;B41J2/16;B81C1/00;H01L41/09;H01L41/22 主分类号 B41J2/045
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