发明名称 Remote diagnostic system and method for semiconductor manufacturing equipment
摘要 A remote diagnostic system for semiconductor manufacturing equipment which diagnoses user's semiconductor manufacturing equipment connected to a piece of diagnostic equipment which is provided by a third party through a communication network. The diagnostic equipment having at least one diagnostic program which diagnoses said semiconductor manufacturing equipment and a control section which starts the diagnostic program when accessed by a specific user terminal which has been given an access right, and the terminal sends data which is requested by the diagnostic equipment for diagnosis and receives a result of diagnosis from the diagnostic equipment.
申请公布号 US6618692(B2) 申请公布日期 2003.09.09
申请号 US20010791761 申请日期 2001.02.26
申请人 HITACHI, LTD. 发明人 TAKAHASHI KAZUE;TSUMAKI NOBUO;YAMAMOTO HIDEYUKI
分类号 G05B23/02;H01L21/66;(IPC1-7):G06F11/30 主分类号 G05B23/02
代理机构 代理人
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