发明名称 |
Remote diagnostic system and method for semiconductor manufacturing equipment |
摘要 |
A remote diagnostic system for semiconductor manufacturing equipment which diagnoses user's semiconductor manufacturing equipment connected to a piece of diagnostic equipment which is provided by a third party through a communication network. The diagnostic equipment having at least one diagnostic program which diagnoses said semiconductor manufacturing equipment and a control section which starts the diagnostic program when accessed by a specific user terminal which has been given an access right, and the terminal sends data which is requested by the diagnostic equipment for diagnosis and receives a result of diagnosis from the diagnostic equipment.
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申请公布号 |
US6618692(B2) |
申请公布日期 |
2003.09.09 |
申请号 |
US20010791761 |
申请日期 |
2001.02.26 |
申请人 |
HITACHI, LTD. |
发明人 |
TAKAHASHI KAZUE;TSUMAKI NOBUO;YAMAMOTO HIDEYUKI |
分类号 |
G05B23/02;H01L21/66;(IPC1-7):G06F11/30 |
主分类号 |
G05B23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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