发明名称 Methods of manufacturing semiconductor devices
摘要 A planarization method includes forming a dummy pattern in a film over a substrate. The dummy pattern includes a plurality of concave and convex portions. A chemical-mechanical polishing process is applied to the film, with the dummy pattern providing planarization of enhanced uniformity in comparison with known techniques.
申请公布号 US6617663(B2) 申请公布日期 2003.09.09
申请号 US20020090484 申请日期 2002.03.01
申请人 SEIKO EPSON CORPORATION 发明人 HORIE TOMOKAZU;SUGIYAMA SHINICHI
分类号 H01L21/3105;H01L21/762;(IPC1-7):H01L29/00 主分类号 H01L21/3105
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