| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an evaluation circuit capable of performing evaluation in a state close to actual operation at the evaluation of LSIs and to reduce the size of a testing circuit. <P>SOLUTION: The LSI evaluation circuit for monitoring signals inside the LSIs, connected to an AGP bus comprises both a register for setting test mode and normal mode and a selector for switching between a signal for the monitoring and a normal signal, according to the setting of the register. Signals from the selector are outputted to the AGP bus, and data inside the LSIs, after data transfer buffering using a strobe, are outputted to an SBA terminal without making them stored in a lead buffer. <P>COPYRIGHT: (C)2003,JPO |
