| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device in which memory tests of a plurality of test patterns are performed and its test time can be shortened. SOLUTION: At testing, external input instruction of a plurality of number of times is inputted to a decoder circuit, selected results of each of external input instruction of the plurality of number of times inputted to the decoder circuit are held in a holding circuit, first selection lines to be selected out of a plurality of first selection lines in accordance with holding contents are selected in parallel. Thereby, the number of times of selecting operation in write of data can be reduced, and a test time can be shortened. COPYRIGHT: (C)2003,JPO
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