PARALLEL TEST SYSTEM FOR SEMICONDUCTOR MEMORY DEVICES

摘要

PROBLEM TO BE SOLVED: To increase the number of parallel tests of semiconductor memory devices even in utilizing limited input/output channels of a test device. SOLUTION: This system is a parallel test system of semiconductor memory devices in which the number of parallel tests can be increased using channels corresponding to the number of channels short-circuited by short-circuiting an information input/output pin corresponding to a semiconductor memory device to be tested, connecting the pin to an input-output channel of a test board through a switch, or short-circuiting a drive pin corresponding to a semiconductor memory device to be tested and connecting it to a drive channel of a test board. COPYRIGHT: (C)2003,JPO