| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a trigger signal generation circuit of a bit error measuring instrument capable of obtaining a trigger signal by providing only one comparator for a 16-bit parallel signal to perform pattern detection and re-timing a coincidence output pulse of the comparator with a fast clock signal. <P>SOLUTION: This trigger signal generation circuit of the bit error measuring instrument for generating a trigger signal with an optional bit phase of an M system random pattern includes a comparing means 4 for comparing a preceding parallel pattern to be multiplexed from an M system random pattern generator 1 with a preset waiting pattern, a first re-timing means 5 for re-timing a pattern coincidence signal from the comparing means with a low-speed clock signal, and a second re-timing means 6 for re-timing a re-timing signal from the first re-timing means with a high-speed clock signal, and outputs an output from the second re-timing means as a trigger signal. <P>COPYRIGHT: (C)2003,JPO</p> |
