发明名称 CONTACT HEAD FOR INSPECTING ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To achieve highly reliable pressure contact with electrode pads of an electronic component, by machining a contact head for inspecting the electronic component into a single part structure, highly accurately setting the relative location of a second support block to a first support block in the contact head, i.e., the relative locations of pressure contact ends, and soundly and elastically inclining the support blocks for carrying the pressure contact ends. SOLUTION: The contact head for inspecting the electronic components is provided with the first support block 1 arranged above, the second support block 2 arranged below, and a large number of the pressure contact ends 4 arranged at the front end of the second support block 2. The lower surface of the first support block 1 and the upper surface of the second support block 2 are connected to each other by a sprung hinge 12 metal-worked, integrally with both blocks 1 and 2. The second support block 2 is elastically and vertically inclined with the pressure contact ends 4 in side-to-side directions or forward and backward directions via the sprung hinge 12, to obtain appropriate parallel pressure contact with an electrode pad 6 of the electronic component 5. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003248033(A) 申请公布日期 2003.09.05
申请号 JP20020045380 申请日期 2002.02.21
申请人 SOUSHIYOU TEC:KK 发明人 OKUNO TOSHIO;NAGASHIMA MASATOMO;KOKUZO TOSHIO;SHIOKAWA TAKEJI
分类号 G01R1/06;G01R31/00;G01R31/28;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R1/06
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