发明名称 |
SURFACE FOREIGN MATTER INSPECTION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a surface foreign matter inspection device that realizes short time for foreign matter inspection and high detection sensitivity. SOLUTION: The surface foreign matter inspection device for inspecting foreign matter on an inspected body 4 with an optical means comprises a stage 4a movable with the inspected body 4 mounted thereon; a light radiating means 5 for radiating light onto the surface of the inspection body 4; a light focusing means 12 having a cylindrical mirror 1 for reflecting scattered light 3a by foreign matter on the inspected body 4 into parallel light 3b, and a focusing lens 2 for focusing the parallel light 3b; a light detecting means 6 for detecting the focused light; and an information processor 100 for processing an output signal of the light detecting means 6 and position information about the foreign matter on the inspected body 4. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003247957(A) |
申请公布日期 |
2003.09.05 |
申请号 |
JP20020049918 |
申请日期 |
2002.02.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KIMURA SHUNSUKE;YAMAMOTO YOSHIHARU |
分类号 |
G01N21/956;G01N21/88;G01N21/94;G01N21/95;H01L21/66;(IPC1-7):G01N21/956 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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