发明名称 SURFACE FOREIGN MATTER INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a surface foreign matter inspection device that realizes short time for foreign matter inspection and high detection sensitivity. SOLUTION: The surface foreign matter inspection device for inspecting foreign matter on an inspected body 4 with an optical means comprises a stage 4a movable with the inspected body 4 mounted thereon; a light radiating means 5 for radiating light onto the surface of the inspection body 4; a light focusing means 12 having a cylindrical mirror 1 for reflecting scattered light 3a by foreign matter on the inspected body 4 into parallel light 3b, and a focusing lens 2 for focusing the parallel light 3b; a light detecting means 6 for detecting the focused light; and an information processor 100 for processing an output signal of the light detecting means 6 and position information about the foreign matter on the inspected body 4. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003247957(A) 申请公布日期 2003.09.05
申请号 JP20020049918 申请日期 2002.02.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KIMURA SHUNSUKE;YAMAMOTO YOSHIHARU
分类号 G01N21/956;G01N21/88;G01N21/94;G01N21/95;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01N21/956
代理机构 代理人
主权项
地址