发明名称 Test apparatus
摘要 In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP' are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH' of the even side and the decision edge HL of the odd side, respectively.
申请公布号 US2003167145(A1) 申请公布日期 2003.09.04
申请号 US20020159146 申请日期 2002.05.31
申请人 HITACHI, LTD. 发明人 OONISHI FUJIO;SHINBO KENICHI;ORIHASHI RITSURO;FUKUZAKI MASASHI;MOTOKI NOBUO
分类号 G01R31/319;G01R31/28;G01R31/3193;(IPC1-7):G06F19/00 主分类号 G01R31/319
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