发明名称 |
GROUP III-V NITRIDE SEMICONDUCTOR MULTILAYER STRUCTURE AND ITS PRODUCTION PROCESS |
摘要 |
A multilayer structure having a GaN semiconductor crystal growth layer of high quality in which a crystal growth layer of a group III-V nitride semiconductor such as GaN is formed over a substrate with a buffer layer of AlxGa1-xN (0<x<1) interposed between the crystal growth layer and the substrate. A method for producing such a structure is also disclosed in which a buffer layer of AlxGa1-xN (0<x<1) is formed on a substrate at a growth temperature of 600 to 900°C and a crystal growth layer of a III-V nitride semiconductor is formed on the buffer layer.
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申请公布号 |
WO03073514(A1) |
申请公布日期 |
2003.09.04 |
申请号 |
WO2003JP01935 |
申请日期 |
2003.02.21 |
申请人 |
THE FURUKAWA ELECTRIC CO., LTD.;YOSHIDA, SEIKOH |
发明人 |
YOSHIDA, SEIKOH |
分类号 |
C30B25/02;H01L21/20;H01L21/205;H01L29/20;(IPC1-7):H01L29/20 |
主分类号 |
C30B25/02 |
代理机构 |
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主权项 |
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地址 |
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