发明名称 RAISED EXTENSION STRUCTURE FOR HIGH PERFORMANCE CMOS
摘要 In a process of fabricating on a substrate a CMOS semiconductor device having a gate electrode, a raised source, and a raised drain, the improvement comprising further incorporating a raised extension, comprising: providing a silicon surface on an insulator layer; proving a gate adjacent to an intended source/drain region; providing an offset spacer adjacent to the gate; growing a source/drain region by selective epitaxy; forming an extension with one or more dopants by ion implantation; and forming a hdd spacer.
申请公布号 US2003166323(A1) 申请公布日期 2003.09.04
申请号 US20020085055 申请日期 2002.03.01
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 VIETZKE DIRK;SCHAFBAUER THOMAS;BRIGHTEN JAMES;EHRENWALL BIRGIT VON
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/336
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