发明名称 |
Partitionable embedded circuit test system for integrated circuit |
摘要 |
A flexible built-in self-test (BIST) circuit is incorporated into an integrated circuit (IC) for testing one or random access memories or other memories embedded in an integrated circuit regardless of the number, size or test requirements of the memories. Input data from a controller that may be conveniently partitioned among components internal and external to the IC, supplies data to the BIST circuit indicating the size of the embedded memories to be tested and selecting from among several modes of BIST operation.
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申请公布号 |
US2003167427(A1) |
申请公布日期 |
2003.09.04 |
申请号 |
US20030401899 |
申请日期 |
2003.03.31 |
申请人 |
CREDENCE SYSTEMS CORPORATION |
发明人 |
KRAUS LAWRENCE;BATINIC IVAN-PIERRE;LORANGER MARC P.;RANGA HIRALAL |
分类号 |
G11C29/46;G11C29/48;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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