发明名称 |
System and method for testing a circuit |
摘要 |
Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.
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申请公布号 |
US2003167430(A1) |
申请公布日期 |
2003.09.04 |
申请号 |
US20020187116 |
申请日期 |
2002.06.28 |
申请人 |
BARBERA GEORGE E.;CROHN DAVID C. |
发明人 |
BARBERA GEORGE E.;CROHN DAVID C. |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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