发明名称 APPARATUS FOR PRODUCING PLASMA AND ETCHING METHOD USING THE SAME
摘要 PURPOSE: An apparatus for producing plasma is provided to easily control an etch rate and remarkably increase an etch rate by controlling a period for turning on/off power or a duty ratio. CONSTITUTION: A power supply(300) is prepared. A reaction chamber(308) receives power from the power supply and generates plasma, containing at least one sample(310). A power supply unit supplies the power from the power supply to the reaction chamber. A control unit(320) turns on/off the power, coupled to the power supply. The control unit controls the period for turning on/off the power or duty ratio to control the etch rate using plasma.
申请公布号 KR20030070976(A) 申请公布日期 2003.09.03
申请号 KR20020010456 申请日期 2002.02.27
申请人 KWON, KWANG HO 发明人 KWON, KWANG HO
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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