| 摘要 |
A method of simultaneously measuring the thickness, group index of refraction, and top and bottom surface profiles of a sample, includes the steps of locating the sample between a surface of a transparent optical flat and a parallel reflective surface such that the respective optical distances between any two of the surface of the optical flat, the top surface of the sample, the bottom surface of the sample, and the reflective surface are distinct and in a known relative optical distance relationship, the distance between the surface of the transparent optical flat and the parallel reflective surface being known. A low-coherent light interferometer operating in an autocorrelation configuration is employed to measure the distance between the optical flat surface and the top surface of the sample, the optical thickness of the sample, and the distance between the bottom surface of the sample and the reflective surface at a plurality of locations over the sample, employing the known relative optical distance relationships. Top and bottom surface profiles and a thickness profile of the sample are generated from the measured distances and the known distance between the surface of the transparent optical flat and the parallel reflective surface. An group index of refraction profile is generated from the measured optical thickness and bottom surface profiles.
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