发明名称 Production of metal insulator metal (MIM) structures using anodizing process
摘要 Metal-insulator-metal capacitor structures are formed in semiconductor substrates using an anodization procedure on deposited underlying metalization followed by deposition of the second metal and planarization by chemical-mechanical polishing or other procedures. The process is additive in character, as opposed to traditional subtractive etch processes for forming capacitor structures. In addition, the process can be used in damascene applications, and can be used to form a wide variety of capacitive structures while reducing the number of mask layers required for formation.
申请公布号 US6613641(B1) 申请公布日期 2003.09.02
申请号 US20010764834 申请日期 2001.01.17
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 VOLANT RICHARD P.;COTTE JOHN M.;PETRARCA KEVIN S.;STEIN KENNETH J.
分类号 H01L27/04;H01L21/02;H01L21/316;H01L21/822;(IPC1-7):H01L21/823 主分类号 H01L27/04
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