发明名称 Semiconductor device and method for forming contact holes in a semiconductor device
摘要 A protective film (14) on a conductor (11d), where a contact hole (22) is to be formed, is removed in advance in a forming process of an etched-away opening (20) to expose the top portion of the corresponding conductor (11d) from the top surface of an insulating film (15), which has buried therein the conductor (11d) covered with the protective film. The etched-away opening (20) is refilled with the same kind of material as that for the insulating film (15), and then two contact holes, one (21) that opens to the semiconductor substrate (10) substantially devoid of the protective film and the other (22) that opens to the conductor (11d), are formed by simultaneous etching under substantially the same condition.
申请公布号 US6613684(B2) 申请公布日期 2003.09.02
申请号 US20010969991 申请日期 2001.10.04
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 FUJIMOTO MAMORU
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/302 主分类号 H01L21/28
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