发明名称 Method for supporting a semiconductor wafer during processing
摘要 A semiconductor wafer is processed while being supported without mechanical contact. Instead, the wafer is supported by gas streams emanating from a large number of passages in side sections positioned very close to the upper and lower surface of the wafer. The gas heated by the side sections and the heated side sections themselves quickly heat the wafer to a desired temperature. Process gas directed to the "device side" of the wafer can be kept at a temperature that will not cause deposition on that side section, but yet the desired wafer temperature can be obtained by heating non-process gas from the other side section to the desired temperature. A plurality of passages around the periphery of the wafer on the non-processed side can be employed to provide purge gas flow that prevents process gas from reaching the non-processed side of the wafer and the adjacent area of that side section.
申请公布号 US6613685(B1) 申请公布日期 2003.09.02
申请号 US20000717702 申请日期 2000.11.20
申请人 ASM INTERNATIONAL N.V. 发明人 GRANNEMAN ERNST HENDRIK AUGUST;HUUSSEN FRANK
分类号 C23C16/44;C23C16/455;C23C16/458;H01L21/00;H01L21/302;H01L21/677;H01L21/683;(IPC1-7):H01L21/302 主分类号 C23C16/44
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