发明名称 Method and apparatus for holding failing information of a memory built-in self-test
摘要 A network interface controller arrangement and a method of testing a memory arrangement uses a register to hold failing information from a memory built-in self test (MBIST). The register is accessible to a processor through a bus interface of the network interface controller. The processor performs a read operation through the bus interface upon the completion of an MBIST to examine the failing information.
申请公布号 US6615378(B1) 申请公布日期 2003.09.02
申请号 US20000504899 申请日期 2000.02.16
申请人 ADVANCED MICRO DEVICES, INC. 发明人 DWORK JEFFREY
分类号 G01R31/3187;(IPC1-7):G01R31/28 主分类号 G01R31/3187
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