| 摘要 |
A tester apparatus for electronic components has a tester unit and one or more first contactor apparatus next to one another for making contact with the electronic components. A first component carrier carries components in a first plane, and it can be positioned by a supply device such that the first contactor apparatus can contact the components on the first component carrier. A second component carrier is disposed to carry the components in a second plane. One or more second contactor apparatus contact the electronic components in a second plane for connection to the tester unit. The first and second component carriers are disposed such that, when the first contactor apparatus makes contact with the components on the first component carrier, contact is made with the components on the second component carrier essentially simultaneously using the second contactor apparatus.
|
